Correlative atom probe tomography and optical spectroscopy: An original gateway to materials science and nanoscale physics

Organic Materials and Organic/Inorganic Heterostructures in Atom Probe Tomography

Nanoscale transistors: Physics and materials

We analyze a modern-day 65nm MOSFET technology to determine its electrical characteristics and intrinsic ballistic efficiency. Using that information, we then predict the performance of similar devices comprised of different materials, such as high-k gate dielectrics and III-V channel materials. The effects of series resistance are considered. Comparisons are made between the performance of the...

FIB Preparation of Bone–Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

Osseointegration refers to the direct bonding between titanium implants and bone, making it one of the key factors for the success of reconstructive and regenerative orthopaedic and dental surgeries [1]. Resolving the implantbone interface with high chemical or spatial resolution enables a clearer determination of bone growth mechanisms at the implant interface and optimal modification of impl...

Atom probe tomography in nanoelectronics

The role of laser assisted atom probe tomography (APT) in microelectronics is discussed on the basis of various illustrations related to SiGe epitaxial layers, bipolar transistors or MOS nano-devices including gate all around (GAA) devices that were carried out at the Groupe de Physique des Matériaux of Rouen (France). 3D maps as provided by APT reveal the atomic-scale distribution of dopants a...

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography.

In many cases, the three-dimensional reconstructions from atom probe tomography (APT) are not sufficiently accurate to resolve crystallographic features such as lattice planes, shear bands, stacking faults, dislocations or grain boundaries. Hence, correlative crystallographic characterization is required in addition to APT at the exact same location of the specimen. Also, for the site-specific ...